Expert processing capabilities

A suite of state-of-the-art electron, ion, and x-ray microscopy provides high spatial resolution imaging and compositional analysis, in 2D and 3D (destructively or non-destructively).

Transmission Electron Microscope

As one of the first operators in Western Canada, nanoFAB provides training and access to JEOL JEM-ARM200CF Transmission Electron Microscope

  • 200, 80, and 60 kV acceleration voltage
  • <0.1 nm resolution (HAADF STEM)
  • Large-angle SDD-EDX detector
  • In-situ heating and electrochemical holders
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